Testability analysis for mixed analog/digital circuit test generation and design for test
Industry trends aimed at procuring greater levels of circuit performance have triggered a proliferation of analog and digital subsystems fabricated side-by-side on the same die. The combined requirements for both high-speed digital and high-precision analog functionality pose unique challenges to mixed analog/digital circuit designers and test engineers. Specifically, monolithic mixed-signal ICs are often difficult to test (verify its full functionality) and can require a significant amount of time. Long test times and difficulty in developing test programs has been identified as a significant contributor to this important problem.This dissertation investigates computer-aided design (CAD) methodologies for analyzing the testability of mixed-signal integrated circuits (ICs). Testability information, if provided early in the design process, can help identify potential design and test problems and aid in the subsequent redesign. In our approach, SPICE compatible model parameters are used to efficiently generate a set of testability models which are used in novel design-for-test methodologies and automatic test pattern generation algorithms. The new methods are applicable to virtually any analog, digital or mixed-signal circuits and systems.This manuscript also discusses the implementation of the testability analysis algorithms in an industry-compatible test program development system called REIGN. For validation, the strategy is effectively demonstrated using several mixed-signal benchmark circuits.
- Electrical engineering