A Digital Method For Phase Noise Measurement
| dc.contributor.advisor | Soma, Mani | en_US |
| dc.contributor.author | Ecker, Allan Christopher | en_US |
| dc.date.accessioned | 2014-04-30T16:24:01Z | |
| dc.date.available | 2015-12-14T17:55:54Z | |
| dc.date.issued | 2014-04-30 | |
| dc.date.submitted | 2014 | en_US |
| dc.description | Thesis (Ph.D.)--University of Washington, 2014 | en_US |
| dc.description.abstract | An all-digital method is used to detect sinusoidal phase noise components while reducing the need for computation intensive post-processing. We use the frequency-selective behavior of a narrow bandwidth infinite impulse response (IIR) digital filter to replace the frequency- domain evaluation of an FFT. This form of digital post-processing reduces the calculation overhead of making frequency-domain observations. We provide a model for the inherent nonidealities of the relevant quantization processes which will need to be managed in a practical implementation of this technique for manufacturing test. | en_US |
| dc.embargo.terms | Delay release for 6 months -- then make Open Access | en_US |
| dc.format.mimetype | application/pdf | en_US |
| dc.identifier.other | Ecker_washington_0250E_12792.pdf | en_US |
| dc.identifier.uri | http://hdl.handle.net/1773/25477 | |
| dc.language.iso | en_US | en_US |
| dc.rights | Copyright is held by the individual authors. | en_US |
| dc.subject | measurement; phase noise; TDC; test | en_US |
| dc.subject.other | Electrical engineering | en_US |
| dc.subject.other | electrical engineering | en_US |
| dc.title | A Digital Method For Phase Noise Measurement | en_US |
| dc.type | Thesis | en_US |
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