Modeling of antibiotic resistance in the ICU - US Slant
| dc.contributor.author | Lipsitch, Marc | en_US |
| dc.contributor.author | Bergstrom, Carl T. | en_US |
| dc.date.accessioned | 2004-11-02T04:25:30Z | en_US |
| dc.date.accessioned | 2007-06-13T19:58:01Z | |
| dc.date.available | 2004-11-02T04:25:30Z | en_US |
| dc.date.available | 2007-06-13T19:58:01Z | |
| dc.date.issued | 2002 | en_US |
| dc.description.abstract | Mathematical models are valuable tools with which to predict and explain the epidemiology of nosocomial infection. As such, modeling will play a crucial role in the effort to control the growing threat posed in hospitals by antibiotic-resistant bacteria. In this chapter, we illustrate the utility of the model-based approach, using a simple mathematical model of colonization and infection by antibiotic-sensitive and resistant bacteria in a hospital setting. The model explains a number of otherwise counterintuitive observations regarding the spread of nosocomial resistance: (1) non-specific infection control measures such as hand-washing will disproportionately reduce the prevalence of resistant bacteria within the hospital; (2) resistance-control interventions should generate reductions in resistance much more rapidly in hospitals than in communities as a whole; (3) treatment with one antibiotic may be an individual risk factor for acquisition of resistance to another antibiotic, even in the absence of genetically linked resistance mechanisms. | en_US |
| dc.format.extent | 78198 bytes | en_US |
| dc.format.mimetype | application/pdf | en_US |
| dc.identifier.citation | Lipsitch, M. and C. T. Bergstrom. Chapter 19 in R. A. Weinstein and M. Bonten, eds., Infection Control in the ICU environment. Kluwer. 2002. | en_US |
| dc.identifier.isbn | 0792374150 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1773/1998 | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Kluwer | en_US |
| dc.title | Modeling of antibiotic resistance in the ICU - US Slant | en_US |
| dc.type | Book chapter | en_US |
